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 Chemistry and Biotechnology - ZEISS - 3D X-Ray Microscop - ZEISS Xradia 410 Versa Series



ZEISS is widely accepted and used by the scientific community and the industry in the X-Ray 3D microscopic imaging system series with more than 50 synchrotron laboratory fields worldwide. At present, ZEISS has successfully entered biomedical, life science, oil and gas exploration, and nano imaging in addition to its mature applications in semiconductor packaging and various circuit board industry (PCB) failure analysis. Applications and related fields such as advanced materials development. ZEISS is the only equipment supplier to offer 2D and 3D X-Ray imaging solutions in micron and nanoscale, and 3D high image resolution will also lead you into a new tomography field.
The Versa and Ultra series eliminate the need for traditional pre-dye treatment of samples and provide fast, non-destructive surface and internal structural analysis of biological materials. From semiconductor fault analysis, drug development, molecular imaging, stem cell research, tissue and organ analysis, and the development of advanced materials, there are quite mature applications.

3D X-Ray Microscope - ZEISS Xradia 600 Versa Series

Non-destructive high resolution 3D X-Ray Microscopy
Main Features:
icon Unlock new degrees of versatility for your scientific discovery and industrial research with the ZEISS Xradia 600-series Versa 3D X-ray microscopes (XRM): the most advanced models in the ZEISS Xradia Versa family. Building on industry-leading resolution and contrast, ZEISS Xradia 600-series Versa extends the boundaries of non-destructive imaging for maximum flexibility to accelerate your research.
Standard Certification:
icon
Application:
icon Materials Research
Life Sciences
Natural Resources
Electronics (Semiconductor)
Specification:
icon Spatial Resolution: 0.5 μm
Minimum Achievable Voxel: 40 nm

3D X-Ray Microscope - ZEISS Xradia 500 Versa Series

Non-destructive high resolution 3D X-Ray Microscopy
Main Features:
icon Xradia Versa solutions help you extend your research beyond the limits of projection-based micro-and nano-CT systems with true spatial resolution of 0.7 μm and a minimum achievable voxel size of 70 nm. Where traditional tomography relies on a single stage of geometric magnification, Xradia 520 Versa features a unique two-stage process based on synchrotron-caliber optics. Experience flexible contrast, a high ease of use, and our breakthrough Resolution at a Distance (RaaD) for unprecedented lab-based exploration for a diverse array of applications, sample types and sizes. X-Ray vision enables you to acquire high resolution interior tomographies. Additionally the non-destructive nature of X-Rays and our multi-length scale capabilities allow you to image the same sample across a wide range of magnifications.
Standard Certification:
icon
Application:
icon Materials Research
Life Sciences
Natural Resources
Electronics (Semiconductor)
Specification:
icon Spatial Resolution: 0.7 μm
Minimum Achievable Voxel: 70 nm

3D X-Ray Microscop - ZEISS Xradia 410 Versa Series

Non-destructive high resolution 3D X-Ray Microscopy
Main Features:
icon The Xradia 410 Versa bridges the gap between high-performing X-ray microscopes and less powerful, lower-cost computed tomography (CT) systems. Delivering non-destructive 3D imaging with industry best resolution, contrast, and in situ capabilities, the Xradia 410 Versa promotes groundbreaking research for the widest range of sample sizes. A powerful, cost-efficient "workhorse" solution, the instrument enhances the imaging workflow in diverse lab environments.
Standard Certification:
icon
Application:
icon Materials Research
Life Sciences
Natural Resources
Electronics (Semiconductor)
Specification:
icon Spatial Resolution: 0.9 μm
Minimum Achievable Voxel: 100 nm

3D X-Ray MicroCT - ZEISS Xradia Context microCT

Non-destructive high resolution 3D X-Ray MicroCT
Main Features:
icon ZEISS Xradia Context microCT, a large field of view, nondestructive 3D X-Ray micro-computed tomography system. ZEISS Xradia Context is your imaging solution for a variety of 3D characterization and inspection needs, spanning from large intact samples to reveal interior details in their full 3D context, as well as small samples at maximum geometric magnification to resolve fine features with high resolution and high contrast. Built on the proven ZEISS Xradia platform, Xradia Context provides you with superb image quality, stability, and usability, along with an efficient workflow environment and high throughput scanning. Enter the ZEISS Xradia ecosystem with a robust X-Ray system to address your needs today, and receive assurance for tomorrow through future upgrades or field conversion of your Xradia Context microCT to an Xradia Versa X-Ray microscope.
Standard Certification:
icon
Application:
icon Materials Research
Life Sciences
Natural Resources
Electronics (Semiconductor)
Specification:
icon Spatial Resolution: 0.95 μm
Minimum Achievable Voxel: 500 nm

Nanoscale X-Ray Imaging - ZEISS Xradia 800 Ultra Series

Nanoscale X-Ray Imaging
Main Features:
icon Xradia 810 Ultra increases the throughput of nanoscale, three-dimensional X-Ray imaging by up to a factor of 10. This innovative X-Ray microscope (XRM) operates at 5.4 keV, a lower energy that delivers better contrast and image quality for medium to low Z samples and other materials used throughout science and industry. Better contrast enables higher-quality tomographies to be acquired an order of magnitude faster while achieving resolution down to 50 nm.
Standard Certification:
icon
Application:
icon Materials Research
Life Sciences
Natural Resources
Electronics (Semiconductor)
Specification:
icon Spatial Resolution: 50-150 nm
Field of View: 16-65 μm
Voxel size: 16-64 nm
 
 
 
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