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  LCD - Toho - FPD 3D METROLOGY SYSTEM(License: (ZYGO)



FPD 3D METROLOGY SYSTEM(License: (ZYGO)
FPD 3D METROLOGY SYSTEM
Toho Optical profilers are white light interferometer systems, offering fast, non-contact, high-precision 3D metrology of surface features. Toho systems include the proprietary MetroPro® Software. Choosing the right surface measurement system depends on your application's requirements, including precision, speed, automation, configuration flexibility, and vertical range. The FPM is a series specifically designed to inspect cellular flat panels or large displays requiring high-res analyses. Using ZYGO's patented scanning white light interferometry (SWLI) technology, the FPM series 3D optical surface profilers easily measure a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.
Main Features:
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