Scientech Corporation  
  繁中
   
 

 
 
   
Product
   
Chemistry and Biotechnology
Broadcast Equipment
Semiconductor III-V Group
arrow2 ATEN
arrow2 Auros
arrow2 ClassOne
arrow2 Dawonsys
arrow2 E-SOL
arrow2 FRT
arrow2 HPSP
arrow2 IMT
arrow2 Genmark
arrow2 Kensington
arrow2 Kingsemi
arrow2 Kitec
arrow2 KLA
arrow2 Kostek
arrow2 MDC
arrow2 Micro Image
arrow2 Microtome
arrow2 Muetec
arrow2 Nanonex
arrow2 Neutronix Quintel
arrow2 NGR
arrow2 Nordson
arrow2 Nova
arrow2 ParkSystems
arrow2 Piotech
arrow2 Plasma-Therm
arrow2 Rave
arrow2 Scientech
arrow2 SEMES
arrow2 SiGlaz
arrow2 Sinyang
arrow2 SMEE
arrow2 Tera
arrow2 TMC
arrow2 TOHO
arrow2 TOWA
arrow2 UCP
arrow2 Ulvac
arrow2 Ushio
arrow2 Verity
arrow2 VLSI
arrow2 YES
arrow2 Zeiss
LCD/ LED/ SOLAR/ DATA STORAGE
MEMS
PCB Industry
Packaging & Testing
Used Tool
Scientech Tool
3D Printer
  Semiconductor III-V Group - Park Systems - Park NX10



Park NX10

For LED, Compound, Semiconductor
Main Features:
icon Beter data
Better productivity
Beter research
Standard Certification:
icon 1. Company obtained certificates of ISO 9001
2. Products obtained certificates of SEMI S2
Application:
icon 1. Semiconductor
2. Compound/SiC
Specification:
icon Scanner: Z scanner
AFM head: Guided high-force flexure scanner
Scan range: 15um (optional 30um)
Resolution: 0.015nm
Position detector noise: 0.03nm(bandwidth: 1kHz)
Resonant frequency: >9kHz (typically:10.5kHz)
SICM head:
Flexure-Guided sturcture driven by multiply-stacked piezoelectric stacks
Z scan range: 25um
Position detector noise: 0.03nm( bandwidth: 1kHz)
XY scanner:
Single module flexure XY-scanner with closed-loop control
Scan range: 50 μm × 50 μm (optional 10 μm × 10 μm or 100 μm × 100 μm)
Resolution: 0.05 nm
Position detector noise: < 0.25 nm (bandwidth: 1 kHz)
Out-of-plane motion: < 2 nm (over 40 μm scan)
 
 
 
 
 
Copyright © 2009 SCIENTECH. All rights reserved. Site map