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  Semiconductor III-V Group - Park Systems - Park NX10 (Atomic Force Microscope,AFM)

Park NX10 (Atomic Force Microscope,AFM)

The economical choice for innovative research Park NX10 (Atomic Force Microscope,AFM) has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the Park NX10 (Atomic Force Microscope,AFM) allows you to do your research on time and within budget.
For LED, Compound, Semiconductor
Main Features:
icon Beter data
Better productivity
Beter research
Standard Certification:
icon 1. Company obtained certificates of ISO 9001
2. Products obtained certificates of SEMI S2
icon 1. Semiconductor
2. Compound/SiC
icon Scanner: Z scanner
AFM head: Guided high-force flexure scanner
Scan range: 15um (optional 30um)
Resolution: 0.015nm
Position detector noise: 0.03nm(bandwidth: 1kHz)
Resonant frequency: >9kHz (typically:10.5kHz)
SICM head:
Flexure-Guided sturcture driven by multiply-stacked piezoelectric stacks
Z scan range: 25um
Position detector noise: 0.03nm( bandwidth: 1kHz)
XY scanner:
Single module flexure XY-scanner with closed-loop control
Scan range: 50 μm × 50 μm (optional 10 μm × 10 μm or 100 μm × 100 μm)
Resolution: 0.05 nm
Position detector noise: < 0.25 nm (bandwidth: 1 kHz)
Out-of-plane motion: < 2 nm (over 40 μm scan)
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