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 Semiconductor III-V Group - SiGlaz - Advance Defect Analysis and Management System

Advance Defect Analysis and Management System
Advance Defect Analysis and Management System
1. Analyze wafer maps or images automatically after inspection or metrology. When an excursion (signature) is detected, send an alarm to the user or interface to MES.
2. Provide Intelligent Reporting System to automatically generate reports and trend charts.
3. Support Real-time Process Monitor using flexible SPC system with integrated database.
4. Provide Software Development outsourcing services for semiconductor equipment manufacturers, fabs or foundries.
5. Please refer to
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