| Fries Research & Technology GmbH (FRT) offers a comprehensive range of
metrological surface measuring systems for the non-destructive investigation of topography,
profile, film thickness, roughness, abrasion, TTV and many other properties for the automotive,
semiconductor, MEMS, optical, photovoltaic and many other industries. |
Company Profile
Semiconductor
III-V Group - Fries Research & Technology GmbH 
